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Journal Articles

Recovery of the electrical characteristics of SiC-MOSFETs irradiated with gamma-rays by thermal treatments

Yokoseki, Takashi; Abe, Hiroshi; Makino, Takahiro; Onoda, Shinobu; Tanaka, Yuki*; Kandori, Mikio*; Yoshie, Toru*; Hijikata, Yasuto*; Oshima, Takeshi

Materials Science Forum, 821-823, p.705 - 708, 2015/07

https://doi.org/10.4028/www.scientific.net/MSF.821-823.705

Oral presentation

Deep levels in electron irradiated semi-insulating 4H-SiC; Electronic, optical and structural observation

Nakane, Hiroki*; Kato, Masashi*; Ichimura, Masaya*; Oshima, Takeshi; Ivanov, I. G.*; Trinh, X. T.*; Son, N. T.*; Janz$'e$n, E.*

no journal, , 

Oral presentation

Ion-induced anomalous charge collection mechanisms in SiC Schottky barrier diodes

Makino, Takahiro; Deki, Manato*; Onoda, Shinobu; Hoshino, Norihiro*; Tsuchida, Hidekazu*; Oshima, Takeshi

no journal, , 

no abstracts in English

Oral presentation

Instability of critical electric field in gate oxide film of heavy ion irradiated SiC MOSFETs

Deki, Manato*; Makino, Takahiro; Kojima, Kazutoshi*; Tomita, Takuro*; Oshima, Takeshi

no journal, , 

no abstracts in English

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